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产品详细说明

产品详细说明:

VDS= -20V

RDS(ON), Vgs@-1.8V, Ids@-2.0A = 100mΩ@TYP

RDS(ON), Vgs@-4.5V, Ids@-2.8A = 71mΩ@TYP

RDS(ON), Vgs@-2.5V, Ids@-2.0A = 83mΩ@TYP

Features

Advanced trench process technology

High Density Cell Design For Ultra Low On-Resistance

SOT- 23 / SOT-323 / SOT-353 Internal Schematic Diagram

Maximum Ratings and Thermal Characteristics (TA = 25 unless otherwise noted)

Parameter

Symbol

Limit

Unit

Drain-Source Voltage

VDS

-20

V

Gate-Source Voltage

VGS

±12

Continuous Drain Current 1)

ID

-2.2

A

Pulsed Drain Current 2)

IDM

-8

Maximum Power Dissipation

TA=25℃

PD

1.25

W

TA=75℃

0.8

Operating Junction and Storage Temperature Range

TJ, Tstg

-55 to 150

Junction-to-Ambient Thermal Resistance (PCB mounted)3)

RθJA

140

W/℃

Note: 1. Fused current that based on wire numbers and diameter

2. Repetitive Rating: Pulse width limited by the maximum junction temperature

3. 1-in2 2oz Cu PCB board

ELECTRICAL CHARACTERISTICS

Parameter

Symbol

Test Condition

Min

Typ

Max

Unit

Static

Drain-Source Breakdown Voltage

BVDSS

VGS = 0V, ID = 250uA

20

--

--

V

Drain-Source On-Stage Resistance

RDS(on)

VGS = -4.5V, ID = -2.8A

--

71.0

100.0

Drain-Source On-Stage Resistance

RDS(on)

VGS = -2.5V, ID = -2.0A

--

83.0

150.0

Drain-Source On-Stage Resistance

RDS(on)

VGS = -1.8V, ID = -2.0A

--

100.0

170.0

Gate Threshold Voltage

VGS(th)

VDS = VGS, ID = 250uA

-0.45

-0.61

-0.9

V

Zero Gate Voltage Drain Current

IDSS

VDS = -9.6V, VGS = 0V

--

--

1

uA

Gate Body Leakage

IGSS

VGS = ±8V, IDS=0uA

--

--

±100

nA

Dynamic3)

Total Gate Charge

Qg

VDS = -6V, ID = -2.8A

VGS = -4.5V

--

--

--

nC

Gate-Source Charge

Qgs

 
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